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Fig. 3

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(a) Capacitance measured at 100 kHz as a function of applied bias on BTO films grown at different oxygen pressures. Curves at P = 14–200 mTorr have been shifted (2 μF/cm2 shift between data sets) for clarity. (b) Variation with oxygen pressure (pO2) of the coercive electric field (top panel) and of the dielectric constant at the maximum of C-V curve (squares) and at maximum applied voltage (triangles).

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