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(a) θ−2θ scans of the BTO/SRO/STO heterostructure for the BTO thin films deposited at different oxygen pressures. (b) RSM around the asymmetric STO (103) Bragg reflection of the heterostructure grown at low, intermediate and high oxygen pressure. (c) In-plane (a), out-of-plane (c) lattice parameters and c/a ratio from XRD data of the relaxed BTO layer. Dotted lines are the a and c values of bulk BTO.
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