Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials
Received: 06 December 2024 / Revised: 19 May 2025 / Accepted: 23 May 2025
The European Physical Journal Applied Physics
Accepted manuscripts
Special Issue on ‘Imaging, Diffraction, and Spectroscopy on the micro/nanoscale (EMC 2024)’, edited by Jakob Birkedal Wagner and Randi Holmestad
In-situ liquid phase TEM of trapped nanoparticles: native-state observation and structural characterization
Received: 11 March 2025 / Revised: 18 June 2025 / Accepted: 30 June 2025
Special Issue on ‘Electromagnetic modeling: from material properties to energy systems (Numelec 2024)’, edited by Lionel Pichon and Junwu Tao
Application of HBM and POD for Insulation Assessment of Oil-paper Insulation System with Nonlinear Properties
Received: 21 September 2024 / Revised: 18 June 2025 / Accepted: 09 July 2025