X-ray metrology for advanced microelectronics     20101
C. Wyon
Published Online: 26 January 2010
DOI: 10.1051/epjap/2009211
| Abstract | PDF (6.406 MB) | References |

Complex optical filter prepared by sputter deposition     20501
M. H. Asghar, M. Shoaib, Z. M. Khan, F. Placido, S. Naseem and M. Mehmood
Published Online: 26 January 2010
DOI: 10.1051/epjap/2009205
| Abstract | PDF (1.438 MB) | References |

Plasma nitriding of aluminium in a pulsed dc glow discharge of nitrogen     21001
S. Naseer, F. U. Khan, N. U. Rehman, A. Qayyum, F. Rahman and M. Zakaullah
Published Online: 26 January 2010
DOI: 10.1051/epjap/2009203
| Abstract | PDF (1.099 MB) | References |

Conductive polymer switching mechanism for high power current-limiting applications     22901
J. J. Shea
Published Online: 22 December 2009
DOI: 10.1051/epjap/2009097
| Abstract | PDF (771.2 KB) | References |

Conductive nanocomposite ceramics as tribological and electrical contact materials     22902
Å. Öberg, Å. Kassman, B. André, U. Wiklund, M. Lindquist, E. Lewin, U. Jansson, H. Högberg, T. Joelsson and H. Ljungcrantz
Published Online: 22 December 2009
DOI: 10.1051/epjap/2009122
| Abstract | PDF (1.013 MB) | References |

Effect of fluorinated lubricants on the friction modes of tin electrical contacts submitted to fretting     22903
R. Belakhdar, S. Noël, D. Alamarguy, O. Schneegans and G. Boccaletti
Published Online: 22 December 2009
DOI: 10.1051/epjap/2009143
| Abstract | PDF (620.2 KB) | References |

Study of the arc behavior in low-voltage circuit breaker by means of optical and magnetic measurements     22904
C. Brdys, D. Cajal, J.-P. Toumazet, F. Gary, A. Laurent and C. Arnoux
Published Online: 22 December 2009
DOI: 10.1051/epjap/2009150
| Abstract | PDF (1.106 MB) | References |

Microscopic study of intermetallic compound formation by in situ method     22905
H. Gauthier, P. Hovington, M. Lagacé, P. Noël, A. Lapointe and D. Gagnon
Published Online: 22 December 2009
DOI: 10.1051/epjap/2009207
| Abstract | PDF (1.687 MB) | References |

Numerical and experimental study of the contact resistance for high copper alloys in force domain 1–100 N     22906
N. Benjemaa, R. El Abdi and E. Carvou
Published Online: 22 December 2009
DOI: 10.1051/epjap/2009208
| Abstract | PDF (1.502 MB) | References |

Nanotomography of electrical contacts – new insights by high resolution 3D analysis of local material degradation     22907
N. Jeanvoine, A. Velichko, C. Selzner and F. Mücklich
Published Online: 22 December 2009
DOI: 10.1051/epjap/2009210
| Abstract | PDF (1.742 MB) | References |

Open Access Option
Current noise up to GHz band generated by slowly breaking silver-compound contacts with external dc magnetic field     22908
H. Inoue, H. Miura, Y. Kayano and K. Miyanaga
Published Online: 26 January 2010
DOI: 10.1051/epjap/2009209
| Abstract | PDF (1.315 MB) | References |

A new simulation approach to characterizing the mechanical and electrical qualities of a connector contact     22909
M. Leidner, H. Schmidt, M. Myers and H. F. Schlaak
Published Online: 26 January 2010
DOI: 10.1051/epjap/2010002
| Abstract | PDF (1.911 MB) | References |

Arc behavior in low-voltage arc chambers     22910
A. Mutzke, T. Rüther, M. Lindmayer and M. Kurrat
Published Online: 26 January 2010
DOI: 10.1051/epjap/2010001
| Abstract | PDF (1.326 MB) | References |