Table of contents
The European Physical Journal Applied Physics
Vol. 25 No. 1 (January 2004)
- Intersubband optical absorption in Si
-doped GaAs
for the donor distribution and thickness as dependent on the applied
electric field
p. 3
E. Ozturk and I. Sokmen
Abstract | References | PDF file (336 KB) - Analysis and modeling of the self-heating effect in SiGe HBTs
p. 11
H. Mnif, Th. Zimmer, J.L. Battaglia and S. Fregonese
Abstract | References | PDF file (844 KB) - Evidence of strain induced structural change in hetero-epitaxial
thin films with metal-insulator transition
p. 25
P. Laffez, O.I. Lebedev, P. Ruello, R. Desfeux, G. Banerjee and F. Capon
Abstract | References | PDF file (1.14 MB) - Pulsed-laser ablation of polytetrafluoroethylene (PTFE) at various
wavelengths
p. 33
N. Huber, J. Heitz and D. Bäuerle
Abstract | References | PDF file (330 KB) - Infrared characterization of environmental samples by pulsed photothermal
spectroscopy
p. 39
W. Seidel, H. Foerstendorf, K.H. Heise, R. Nicolai, A. Schamlott, J.M. Ortega, F. Glotin and R. Prazeres
Abstract | References | PDF file (254 KB) - The effect of a field reversal on the spatial transition
of the electrons from an
active plasma to a field-free remote plasma
p. 45
D. Loffhagen, F. Sigeneger and R. Winkler
Abstract | References | PDF file (1.32 MB) - A mason type analysis of cylindrical ultrasonic micromotors
p. 57
M. Budinger, J.-F. Rouchon and B. Nogarede
Abstract | References | PDF file (500 KB) - Determination of current density distribution in proton exchange membrane fuel cells
p. 67
D. Candusso, J.P. Poirot-Crouvezier, B. Bador, E. Rullière, R. Soulier and J.Y. Voyant
Abstract | References | PDF file (1.32 MB)
Semiconductors and Related Materials
Microelectronics and Optoelectronics
Surfaces, Interfaces and Films
Laser and Optics
Characterization of Materials: Imaging, Microscopy and Spectroscopy
Plasma, Discharge and Processes
Physics of Energy Conversion and Coupled Phenomena
Instrumentation and Metrology
© EDP Sciences 2004



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