The European Physical Journal Applied Physics (EPJ AP)

Table of contents

Eur. Phys. J. Appl. Phys. Vol. 24 No. 3

The European Physical Journal Applied Physics

Vol. 24 No. 3 (December 2003)

Semiconductors and Related Materials

Breakdown voltage analysis of neutron irradiated silicon detectors p. 171
A. Bhardwaj, K. Ranjan, Namrata, S. Chatterji, A.K. Srivastava, A. Kumar, M.K. Jha and R.K. Shivpuri
Abstract | References | PDF file (952 KB)

Influence of an applied electric field on the electronic properties of Si $\mathsf{\delta}$ -doped GaAs p. 189
E. Ozturk, Y. Ergun, H. Sari and I. Sokmen
Abstract | References | PDF file (314 KB)

Microelectronics and Optoelectronics

Degradation kinetics of the spectral emission in polyfluorene light-emitting electro-chemical cells and diodes p. 195
T. Ouisse, O. Stéphan and M. Armand
Abstract | References | PDF file (469 KB)

Magnetism and Superconductivity

Study of high intensity magnetic separation process in grooved plate matrix p. 201
N.M. Sido, A. Mailfert, G. Gillet and A. Colteu
Abstract | References | PDF file (524 KB)

Characterization of Materials: Imaging, Microscopy and Spectroscopy

Crystal-field analysis of the Cr $\mathsf}$ absorption and excitation spectrum in LiGaO $\mathsf$ oxide crystal p. 209
S. Kammoun and M. Kamoun
Abstract | References | PDF file (163 KB)

Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction p. 215
J.-L. Maurice, F. Pailloux, D. Imhoff, N. Bonnet, L. Samet, A. Barthélémy, J.-P. Contour, C. Colliex and A. Fert
Abstract | References | PDF file (1.39 MB)

Identification of physical effects in flying spot photothermal non-destructive testing p. 223
S. Hermosilla-Lara, P.-Y. Joubert and D. Placko
Abstract | References | PDF file (777 KB)

Instrumentation and Metrology

Calibration of a 2 dimensional hydrogenated amorphous silicon thin film position sensitive detector (2D a-Si:H TFPSD) p. 231
K. Gnanvo and Z.Y. Wu
Abstract | References | PDF file (1.39 MB)