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X-ray metrology for advanced microelectronics     20101
C. Wyon
Published online: 26 January 2010
DOI: 10.1051/epjap/2009211
Abstract | PDF (6.406 MB) | References

Complex optical filter prepared by sputter deposition     20501
M. H. Asghar, M. Shoaib, Z. M. Khan, F. Placido, S. Naseem and M. Mehmood
Published online: 26 January 2010
DOI: 10.1051/epjap/2009205
Abstract | PDF (1.438 MB) | References

Plasma nitriding of aluminium in a pulsed dc glow discharge of nitrogen     21001
S. Naseer, F. U. Khan, N. U. Rehman, A. Qayyum, F. Rahman and M. Zakaullah
Published online: 26 January 2010
DOI: 10.1051/epjap/2009203
Abstract | PDF (1.099 MB) | References

Conductive polymer switching mechanism for high power current-limiting applications     22901
J. J. Shea
Published online: 22 December 2009
DOI: 10.1051/epjap/2009097
Abstract | PDF (771.2 KB) | References

Conductive nanocomposite ceramics as tribological and electrical contact materials     22902
Å. Öberg, Å. Kassman, B. André, U. Wiklund, M. Lindquist, E. Lewin, U. Jansson, H. Högberg, T. Joelsson and H. Ljungcrantz
Published online: 22 December 2009
DOI: 10.1051/epjap/2009122
Abstract | PDF (1.013 MB) | References

Effect of fluorinated lubricants on the friction modes of tin electrical contacts submitted to fretting     22903
R. Belakhdar, S. Noël, D. Alamarguy, O. Schneegans and G. Boccaletti
Published online: 22 December 2009
DOI: 10.1051/epjap/2009143
Abstract | PDF (620.2 KB) | References

Study of the arc behavior in low-voltage circuit breaker by means of optical and magnetic measurements     22904
C. Brdys, D. Cajal, J.-P. Toumazet, F. Gary, A. Laurent and C. Arnoux
Published online: 22 December 2009
DOI: 10.1051/epjap/2009150
Abstract | PDF (1.106 MB) | References

Microscopic study of intermetallic compound formation by in situ method     22905
H. Gauthier, P. Hovington, M. Lagacé, P. Noël, A. Lapointe and D. Gagnon
Published online: 22 December 2009
DOI: 10.1051/epjap/2009207
Abstract | PDF (1.687 MB) | References

Numerical and experimental study of the contact resistance for high copper alloys in force domain 1–100 N     22906
N. Benjemaa, R. El Abdi and E. Carvou
Published online: 22 December 2009
DOI: 10.1051/epjap/2009208
Abstract | PDF (1.502 MB) | References

Nanotomography of electrical contacts – new insights by high resolution 3D analysis of local material degradation     22907
N. Jeanvoine, A. Velichko, C. Selzner and F. Mücklich
Published online: 22 December 2009
DOI: 10.1051/epjap/2009210
Abstract | PDF (1.742 MB) | References

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Current noise up to GHz band generated by slowly breaking silver-compound contacts with external dc magnetic field     22908
H. Inoue, H. Miura, Y. Kayano and K. Miyanaga
Published online: 26 January 2010
DOI: 10.1051/epjap/2009209
Abstract | PDF (1.315 MB) | References

A new simulation approach to characterizing the mechanical and electrical qualities of a connector contact     22909
M. Leidner, H. Schmidt, M. Myers and H. F. Schlaak
Published online: 26 January 2010
DOI: 10.1051/epjap/2010002
Abstract | PDF (1.911 MB) | References

Arc behavior in low-voltage arc chambers     22910
A. Mutzke, T. Rüther, M. Lindmayer and M. Kurrat
Published online: 26 January 2010
DOI: 10.1051/epjap/2010001
Abstract | PDF (1.326 MB) | References