EDP Sciences Journals List
Home Table of contents
Subscriber Authentication Point
  Previous issue
Next issue 
Table of contents
Eur. Phys. J. Appl. Phys. Vol. 44 No. 1

The European Physical Journal Applied Physics

Vol. 44 No. 1 (October 2008)

Semi-Special Issue: 10th Meeting of the French Microscopy Society




    Editorial (SFMU)



  • 10th Meeting of the French Microscopy Society - Grenoble 2007     p. 1
    P. Buffat and M. Cheynet
    PDF file (41.01 KB)



    • Imaging, Microscopy and Spectroscopy (SFMU)

  • Gold and silver nanoparticles embedded in dielectric-capping layers studied by HAADF-STEM     p. 3
    D. Babonneau, D. Lantiat, S. Camelio, J. Toudert, L. Simonot, F. Pailloux, M.-F. Denanot and T. Girardeau
    Abstract | PDF file (648.9 KB) | References


  • A combined FEG-SEM and TEM study of silicon nanodot assembly     p. 11
    P. Donnadieu, F. Roussel, V. Cocheteau, B. Caussat, P. Mur and E. Scheid
    Abstract | PDF file (1.341 MB) | References


  • Confocal microscopy of geometrically frustrated hard sphere crystals     p. 21
    R.P.A. Dullens, V.W.A. de Villeneuve, M.C.D. Mourad, A.V. Petukhov and W.K. Kegel
    Abstract | PDF file (3.753 MB) | References



    • Instrumentation and Metrology (SFMU)

  • Tomographic diffractive microscopy of transparent samples     p. 29
    B. Simon, M. Debailleul, V. Georges, V. Lauer and O. Haeberlé
    Abstract | PDF file (1.066 MB) | References


  • Combined analysis with WDS/EDS spectrometers in SEM     p. 37
    M. Briant and D. Balloy
    Abstract | PDF file (690.3 KB) | References



    • Semiconductors and Devices

  • Photoresponsivity enhancement of ZnO/Si photodiodes through use of an ultrathin oxide interlayer     p. 43
    L.-C. Chen and C.-N. Pan
    Abstract | PDF file (441.0 KB) | References



    • Nanomaterials and Nanotechnologies

  • Simulation on the effects of torsion strain on the mechanical properties of SiC nanowires under tensile and compressive loading     p. 47
    Z.-G. Wang, D.-M. Cheng, Z.-J. Li and X.-T. Zu
    Abstract | PDF file (738.7 KB) | References


  • Raman spectroscopy of Si nanoparticles embedded in silica films     p. 51
    I. Stenger, B. Gallas, B. Jusserand, S. Chenot, S. Fisson and J. Rivory
    Abstract | PDF file (431.2 KB) | References



    • Laser, Optics, Optoelectronics and Nanophotonics

  • Heat-treatment effect on the structural and optical properties of flash evaporated Sb2Te3 thin films     p. 59
    H.S. Soliman, S. Yaghmour and H.G. Al-Solami
    Abstract | PDF file (680.0 KB) | References


  • Experimental investigation of noise reduction in an opto-microwave link based on highly-dispersive low-loss fiber     p. 65
    G. Baili, J. Lahitte, M. Alouini, D. Dolfi, J.-P. Huignard and F. Bretenaker
    Abstract | PDF file (360.5 KB) | References



    • Plasma, Discharges and Processes

  • Optical and microwave characteristics of ambient temperature deposited zirconium tin titanate high-k films     p. 71
    D. Pamu, K. Sudheendran, M. Ghanashyam Krishna and K.C.J. Raju
    Abstract | PDF file (545.7 KB) | References



    • Physics of Energy Generation, Conversion and Storage

  • Design of a permanent magnet actuator for linear and rotary movements     p. 77
    G. Krebs, A. Tounzi, B. Pauwels, D. Willemot and M.F. Piriou
    Abstract | PDF file (1.853 MB) | References



    • Physics and Mechanics of Fluids, Microfluidics

  • Modeling electrodeposition of charged nanoparticles onto fuel cell coolant flow channel walls     p. 87
    J.-T. Cheng
    Abstract | PDF file (1.975 MB) | References


  • The relative roles of divergence and velocity slip in the stability of plane channel flow     p. 101
    K.C. Sahu, A. Sameen and R. Govindarajan
    Abstract | PDF file (359.1 KB) | References







© EDP Sciences 2008