Table of contents
The European Physical Journal Applied Physics
Vol. 24 No. 1 (October 2003)
- Effect of roughness on the elastic surface wave propagation
p. 3
A.A. Tarasenko, L. Jastrabìk and N.A. Tarasenko
Abstract | References | PDF file (336 KB) - Microstructure and morphology evolution in chemical solution deposited PbSe films on GaAs(100)
p. 13
M. Shandalov and Y. Golan
Abstract | References | PDF file (822 KB) - About non-Gaussian behaviour of the Debye-Waller factor at large
scattering vectors
p. 21
I.D. Feranchuk, A.A. Minkevich and A.P. Ulyanenkov
Abstract | References | PDF file (390 KB) - Disordered junction arrays used for Coulomb blockade thermometry
p. 27
Y. Yu and W.K. Chow
Abstract | References | PDF file (240 KB) - Calorimetric studies of bulk Se-Te-Pb glassy system
p. 33
Maninder Singh Kamboj and R. Thangaraj
Abstract | References | PDF file (157 KB) - Radiation damage in ion-irradiated
yttria-stabilized cubic zirconia single crystals
p. 37
L. Thomé, J. Fradin, J. Jagielski, A. Gentils, S.E. Enescu and F. Garrido
Abstract | References | PDF file (868 KB) - Resolution of Maxwell's equations by spectral moments method.
Local approach
p. 49
C. Benoit and G. Poussigue
Abstract | References | PDF file (915 KB) - Electrical study of DC positive corona discharge
in dry and humid air containing carbon dioxide
p. 67
S. Lachaud and J.F. Loiseau
Abstract | References | PDF file (1.63 MB) - Light impulses at the dark- to glow discharge transition
in a low pressure point-to-plane gap
p. 75
N. Spyrou, A.E. Ercilbengoa and J.F. Loiseau
Abstract | References | PDF file (316 KB) - Heterodyne refractometer and air wavelength reference at 633 nm
p. 85
S. Topçu, Y. Alayli, J.-P. Wallerand and P. Juncar
Abstract | References | PDF file (206 KB) - Coupling of Rayleigh-Wood anomalies and the
circular Bragg phenomenon in slanted chiral sculptured thin films
p. 91
F. Wang, A. Lakhtakia and R. Messier
Abstract | PDF file (47.3 KB)
Surfaces, Interfaces and Films
Nanomaterials and Nanotechnologies
Characterization of Materials: Imaging, Microscopy and Spectroscopy
Plasma, Discharge and Processes
Instrumentation and Metrology
ErratumErratum:
© EDP Sciences 2003


Table of contents
