Table of contents
The European Physical Journal Applied Physics
Vol. 17 No. 3 (March 2002)
- Stability of wrinkling patterns:
from straight-sided to worm-like structures
p. 173
F. Cleymand, J. Colin, C. Coupeau and J. Grilhé
Abstract | References | PDF file (218 KB) - Annealing and thickness effect on the optical absorption of Ge
Te
and Cu
Ge
Te
films
p. 179
H. El-Zahed, M. Dongol and M. Radwan
Abstract | References | PDF file (289 KB) - Large stress-resistance effect at high frequencies in Co
Fe
Si
B
amorphous ribbon
p. 187
J. Hu, H. Qin, Y. Hao, Y. Li, S. Zhou and Z. Wang
Abstract | References | PDF file (78.1 KB) - Optical anisotropy and EO properties of ferroelectrics TGS and LHP
single crystals using a HAUP technique
p. 189
C. Hernández-Rodríguez, R. Guerrero-Lemus and J. Herreros-Cedrés
Abstract | References | PDF file (337 KB) - Small angle static light scattering: absolute intensity measurements
p. 201
A. Thill, S. Désert and M. Delsanti
Abstract | References | PDF file (401 KB) - Investigation of deposition parameters and output functions, and production of low
coercivity films
p. 209
H. Kockar and T. Meydan
Abstract | References | PDF file (150 KB) - Finite-difference time-domain method for design and analysis of microcavity -
Coupled submicron-width waveguides
p. 215
W. Aroua, D. Gamra, F. AbdelMalek and H. Bouchriha
Abstract | References | PDF file (1.77 MB) - Annealing behaviour of boron implanted defects in Si detector:
impact on breakdown performance
p. 223
S. Chatterji, A. Bhardwaj, K. Ranjan, Namrata, A.K. Srivastava and R.K. Shivpuri
Abstract | References | PDF file (235 KB) - Monte Carlo simulation of nearly kinematic shock fronts in rarefied gases
p. 233
D. Bruno and S. Longo
Abstract | References | PDF file (910 KB) - Iron-free objective lenses II
p. 243
A.S.A. Alamir
Abstract | References | PDF file (98.4 KB) - Spectral approach to displacement evaluation from image analysis
p. 247
B. Wagne, S. Roux and F. Hild
Abstract | References | PDF file (265 KB)
Surfaces, Thin Foils and Nanomaterials
Characterization of materials
Lasers, Optics and Telecommunications
Nano and Micro Electronics, Microsystems and Devices
Physics and Mechanics of Fluids
Instrumentation, Measurement, Metrology
© EDP Sciences 2002


Table of contents
