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[Your name] recommends the following article of The European Physical Journal Applied Physics to you.

Title: Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy
Author(s): C. Riedel, R. Arinero, Ph. Tordjeman, M. Ramonda, G. Lévêque, G. A. Schwartz, D. G. de Oteyza, A. Alegría and J. Colmenero
http://www.epjap.org/10.1051/epjap/2010010

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