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DOI: 10.1051/epjap:1999134
Eur. Phys. J. AP 5, 237-242
Determination of the electron mean free path
in the 1-1.8 eV energy range in
thin gold layers
using ballistic electron emission microscopy
R. Coratger
-
C. Girardin -
R. Pechou -
F. Ajustron -
J. Beauvillain
CEMES/CNRS, 29 rue J. Marvig, B.P. 4347, 31055 Toulouse Cedex 4, France
coratger@cemes.fr
Received: 21 September 1998 / Revised and accepted: 15 December 1998
Abstract
Electron mean free path (
) has been investigated using Ballistic
Electron Emission Microscopy (BEEM). Using the average collector current computed from
large scale BEEM images and a model in which the current exponentially decreases in
terms of metal thickness, a constant value of
= 11 nm has been calculated
in the 1-1.8 eV electron energy range. On small scale images, the study of
well-defined BEEM domains shows that either
or the interface transmission
factor (or both) may differ from their average values. These local variations from one
grain to another are interpreted as interface defects and channeling of the electron
beam due to the electronic and crystallographic of the gold layer.
PACS
61.16.-d Electron, ion, and scanning probe microscopy -
73.40.Ns Metal-nonmetal contacts
Copyright EDP Sciences
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