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DOI: 10.1051/epjap:1999140
Eur. Phys. J. AP 5, 277-281
Spectroscopic study of resonant dielectric structures
in near-field![[*]](/icons/foot_motif.gif)
S. Davy - D. Barchiesi - M. Spajer - D. Courjon
Laboratoire d'Optique P.M. Duffieux
, Université de
Franche-Comté, Institut des Microtechniques,
25030 Besançon Cedex, France
dominique.barchiesi@univ-fcomte.fr
Received: 2 July 1998 / Revised: 29 September 1998 / Accepted: 29 October 1998
Abstract
Gratings can be considered as resonant structures in near-field.
The enhancement of the intensity recorded by Scanning Near-Field
Optical Microscopes (SNOM) is due to interferences in relation with the ratio of
the wavelength to the product of the optical index by the period of the
grating. We discuss the effect of this ratio (in the range 0.9, 1.1) on the
intensity patterns. The influence of the polarization on near-field data is
analyzed in both theoretical computations and experimental result.
PACS
07.79.Fc Near-field scanning optical microscopes
Copyright EDP Sciences
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