Issue Eur. Phys. J. Appl. Phys. Volume 47, Number 3, September 2009 Article Number 30502 Number of page(s) 3 Section Surfaces, Interfaces and Films DOI 10.1051/epjap/2009101 Published online 10 June 2009

Eur. Phys. J. Appl. Phys. 47, 30502 (2009)
DOI: 10.1051/epjap/2009101

Vibrational and X-ray diffraction spectra of SnS film deposited by chemical bath deposition method

S. Aksay, T. Özer and M. Zor

Department of Physics, Anadolu University, 26470, Eskişehir, Turkey

saksay@anadolu.edu.tr

Received: 4 December 2008 / Accepted: 2 April 2009 / Published online: 10 June 2009

Abstract
Tin sulphide films have been deposited onto glass substrates at room temperature by chemical bath deposition using aqueous solution. The structural and vibrational properties of the deposited films have been characterized by X-ray diffraction (XRD), FT-IR and Raman spectroscopy. XRD data indicate that as grown film is polycrystalline in nature and is composed of predominantly orthorhombic phase. Infrared spectrum of the film has been investigated in 4000–400 cm^-1 region. The infrared spectrum of SnS displays several bands. The Raman spectrum studies revealed three peaks (64, 106 and 239 cm^-1) of SnS film. The spectrum analysis also shows that there exists a Sn₂S₃or/and SnS₂ phase in the deposited film.

PACS
71.20.Nr - Semiconductor compounds.
78.30.-J - Infrared and Raman spectra.
78.70.Ck - X-ray scattering.

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