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Eur. Phys. J. Appl. Phys. 46, 32603 (2009)
DOI: 10.1051/epjap:2008148
Compensation of loss to approach –1 effective index by gain in metal-dielectric stacks
J. Zhang1, 2, H. Jiang1, 3, B. Gralak1, S. Enoch1, G. Tayeb1 and M. Lequime11 Institut Fresnel, CNRS, Aix-Marseille Université, Domaine Universitaire de Saint-Jérôme, Service 161, 13397 Marseille Cedex 20, France
2 State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, P.R. China
3 Pohl Institute of Solid State Physics, Tongji University, Shanghai 200092, P.R. China
stefan.enoch@fresnel.fr
Received: 30 January 2008 / Received in final form: 26 March 2008 / Accepted: 2 April 2008 / Published online: 25 July 2008
Abstract
We propose a theoretical study of optimization of
metal-dielectric multilayer in order to approach -1 effective refractive
index for transverse magnetic waves and a wavelength in the visible. The
absorption losses of metal appear to be a crucial factor that affects the
effective properties of the multilayer. Taking advantage of the dispersion
relation of Bloch modes, we show that the losses not only decrease the
transmission of the stack, but also change the negatively refracted angle.
Then, we propose that using a gain-providing semiconductor (GaN) may allow
compensating for the losses in metal layers. In theory, the performances of
the structure can be improved greatly when gain is involved. When
considering finite thickness structures, and with appropriate thickness for
the terminating layers, it is possible to obtain a high transmission of the
structure. A near -1 effective index metal-dielectric stack with high
transmission may pave the way to the realization of negative quasi-isotropic
refraction in the visible or ultraviolet wavelength range.
42.25.-p - Wave optics.
78.66.Bz - Metals and metallic alloys.
78.67.Pt - Multilayers; superlattices.
© EDP Sciences 2009
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