Issue Eur. Phys. J. Appl. Phys. Volume 44, Number 2, November 2008 Page(s) 205 - 209 Section Instrumentation and Metrology DOI 10.1051/epjap:2008133 Published online 17 July 2008

Eur. Phys. J. Appl. Phys. 44, 205-209 (2008)
DOI: 10.1051/epjap:2008133

Analog set-up for non linear dielectric measurements up to 100 kHz

J.-M. Leblond¹, R. Douali², C. Legrand², P. Ropa² and R. Dabrowski<sup>3

1</sup>  Institut Universitaire de Technologie, 19 rue L. David, BP 689, 62228 Calais Cedex, France
²  LEMCEL, 50 rue F. Buisson, BP 717, 62228 Calais Cedex, France
³  Military University of Technology, Kaliskiego 2, 00-908 Warszawa, Poland

Received: 5 September 2007 / Accepted: 30 May 2008 / Published online: 17 July 2008

Abstract
In this paper, we present a new analog set-up for non linear dielectric measurements. The device is based on the auto-balanced bridge principle used in impedance analyzers. Its main advantage is to operate at high frequencies in comparison with a classical current amplifier. This extension consists in extracting the harmonics of a non sinusoidal current crossing the material. The set-up is used to perform non linear dielectric measurements on a ferroelectric liquid crystal and shows better performances than a previously published digital set-up.

PACS
84.30.-r - Electronic circuits.
84.37.+q - Measurements in electric variables.
07.50.-e - Electrical and electronic instruments and components.

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