Issue Eur. Phys. J. AP Volume 17, Number 3, March 2002 Page(s) 173 - 178 Section Surfaces, Thin Foils and Nanomaterials DOI 10.1051/epjap:2002009

Eur. Phys. J. AP 17, 173-178 (2002)
DOI: 10.1051/epjap:2002009

Stability of wrinkling patterns: from straight-sided to worm-like structures

F. Cleymand, J. Colin, C. Coupeau and J. Grilhé

Laboratoire de Métallurgie Physique (UMR 6630) , SP2MI, Bd. P. & M. Curie, 86962 Futuroscope Cedex, France

cleymand@etu.univ-poitiers.fr

(Received: 7 April 2001 / Received in final form: 16 July 2001 / Accepted: 7 December 2001 )

Abstract
The stability of compressed thin films on substrates is discussed in the frame of the F ppl-Von Karman theory of thin plate buckling. The destabilization from pre-existing straight-sided to worm-like patterns is investigated and a critical stress is determined, above which the morphological change of the film occurs. Experimental investigations by atomic force microscopy have been also conducted and the different stages of this evolution have been characterized.

PACS
62.20.Dc - Elasticity, elastic constants.
68.60.Bs - Mechanical and acoustical properties.
68.37.Ps - Atomic force microscopy (AFM).


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