Issue Eur. Phys. J. Appl. Phys. Volume 46, Number 2, May 2009 Article Number 20403 Number of page(s) 5 Section Physics of Organic Materials and Devices DOI 10.1051/epjap/2009038 Published online 27 March 2009

Eur. Phys. J. Appl. Phys. 46, 20403 (2009)
DOI: 10.1051/epjap/2009038

Evaluation of organic sub-monolayers by X-ray based measurements under gracing incident conditions

O. Werzer¹, B. Stadlober², A. Haase², H.-G. Flesch¹ and R. Resel<sup>1

1</sup>  Institute of Solid State Physics, Graz University of Technology, Graz, Austria
²  Institute of Nanostructured Materials and Photonics, Joanneum Research Forschungsgesellschaft mbH, Weiz, Austria

o.werzer@gmx.at

Received: 16 September 2008 / Received in final form: 20 November 2008 / Accepted: 20 January 2009 / Published online: 27 March 2009

Abstract
The structural investigations of model organic systems like pentacene on silicon oxide in the monolayer regime is very important for the basic understanding of initial nucleation process together with the electronic performance of transistor devices. A method for the evaluation of the island formation and layer closing of the first monolayer is introduced. The method is based on specular X-ray reflectivity and diffuse scattering and reveal integral information on the coverage together with the size and separation of pentacene islands. The results are in good agreement with AFM investigation that encourages the use of this type of investigation in in-situ experiments.

PACS
61.05.cc - Theories of X-ray diffraction and scattering.
61.05.cm - X-ray reflectometry (surfaces, interfaces, films).
61.43.Hv - Fractals; macroscopic aggregates (including diffusion-limited aggregates).
68.35.bm - Polymers, organics.

© EDP Sciences 2009

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