- Same authors
-
Related articles
- Recommend this article
- Download citation
- Alert me when this article is cited
- Alert me when this article is corrected
|
Eur. Phys. J. Appl. Phys. 45, 30601 (2009)
DOI: 10.1051/epjap/2009009
Absorption and dispersion studies of thermally evaporated nanocrytallite structure ZnIn2Se4 thin films
H.M. Zeyada, M.S. Aziz and A.S. BehairyDepartment of Physics, Faculty of science at Damietta, New Damietta 34517, Egypt
hzeyada@gmail.com
Received: 4 May 2008 / Received in final form: 5 December 2008 / Accepted: 12 December 2008 / Published online: 6 February 2009
Abstract
ZnIn2Se4 has a polycrystalline structure in as synthesized
condition. It transforms to nanostructure grains of ZnIn2Se4 upon
thermal deposition as thin films. The optical properties of as deposited
ZnIn2Se4 films are studied using spectrophotometer measurements of
transmittance and reflectance at normal incidence of light in wavelength
range (450–2500) nm. The refractive index and absorption index are
calculated and it is found that they are independent of film thickness in
the thickness range (500–790) nm. Absorption analysis showed two types of
electronic transitions; indirect allowed transition with energy gap 1.76 eV
accompanied by phonon of energy 25 meV and direct allowed transition with
energy gap 2.3 eV. The dispersion analysis showed that the oscillator
energy, dispersion energy, dielectric constant at infinite frequency and
lattice dielectric constant are 2.49 eV, 14.36 eV, 6.84 and 8.17,
respectively.
81.40.Tv - Optical and dielectric properties (related to treatment conditions).
© EDP Sciences 2009
| What is OpenURL? |



Document
BibSonomy
CiteUlike
Connotea
Del.icio.us
Digg
Facebook