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Issue Eur. Phys. J. Appl. Phys.
Volume 45, Number 3, March 2009
Article Number 30601
Number of page(s) 6
Section Nanomaterials and Nanotechnologies
DOI 10.1051/epjap/2009009
Published online 06 February 2009

Eur. Phys. J. Appl. Phys. 45, 30601 (2009)
DOI: 10.1051/epjap/2009009

Absorption and dispersion studies of thermally evaporated nanocrytallite structure ZnIn2Se4 thin films

H.M. Zeyada, M.S. Aziz and A.S. Behairy

Department of Physics, Faculty of science at Damietta, New Damietta 34517, Egypt

hzeyada@gmail.com

Received: 4 May 2008 / Received in final form: 5 December 2008 / Accepted: 12 December 2008 / Published online: 6 February 2009

Abstract
ZnIn2Se4 has a polycrystalline structure in as synthesized condition. It transforms to nanostructure grains of ZnIn2Se4 upon thermal deposition as thin films. The optical properties of as deposited ZnIn2Se4 films are studied using spectrophotometer measurements of transmittance and reflectance at normal incidence of light in wavelength range (450–2500) nm. The refractive index and absorption index are calculated and it is found that they are independent of film thickness in the thickness range (500–790) nm. Absorption analysis showed two types of electronic transitions; indirect allowed transition with energy gap 1.76 eV accompanied by phonon of energy 25 meV and direct allowed transition with energy gap 2.3 eV. The dispersion analysis showed that the oscillator energy, dispersion energy, dielectric constant at infinite frequency and lattice dielectric constant are 2.49 eV, 14.36 eV, 6.84 and 8.17, respectively.

PACS
81.40.Tv - Optical and dielectric properties (related to treatment conditions).

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