Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM
Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba
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Accepted: 8 March 2011
Published online: 9 June 2011
Imaging and chemical analysis of individual metallofullerene molecules were successfully carried out without massive destruction using a scanning transmission electron microscope (STEM) operated at 30 kV. Electron energy-loss spectroscopy (EELS) unambiguously identified the constituent atom of each metallofullerene molecule. The profile of EELS chemical map measured across the single atom provides a rough estimate of EELS signal delocalization, which is considerably reduced using accelerating voltage as low as 30 kV.
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