Vibrational and X-ray diffraction spectra of SnS film deposited by chemical bath deposition method
Department of Physics, Anadolu University, 26470, Eskişehir, Turkey
Corresponding author: firstname.lastname@example.org
Accepted: 2 April 2009
Published online: 10 June 2009
Tin sulphide films have been deposited onto glass substrates at room temperature by chemical bath deposition using aqueous solution. The structural and vibrational properties of the deposited films have been characterized by X-ray diffraction (XRD), FT-IR and Raman spectroscopy. XRD data indicate that as grown film is polycrystalline in nature and is composed of predominantly orthorhombic phase. Infrared spectrum of the film has been investigated in 4000–400 cm−1 region. The infrared spectrum of SnS displays several bands. The Raman spectrum studies revealed three peaks (64, 106 and 239 cm-1) of SnS film. The spectrum analysis also shows that there exists a Sn2S3or/and SnS2 phase in the deposited film.
PACS: 71.20.Nr – Semiconductor compounds / 78.30.-J – Infrared and Raman spectra / 78.70.Ck – X-ray scattering
© EDP Sciences, 2009