Topical Issue ITFPC (Innovations on Thin Films Processing and Characterisation)
Issue
Eur. Phys. J. Appl. Phys.
Volume 43, Number 3, September 2008
Topical Issue ITFPC (Innovations on Thin Films Processing and Characterisation)
Page(s) 321 - 325
Section Simulation and Thin Films Characterization
DOI http://dx.doi.org/10.1051/epjap:2008068
Published online 30 April 2008

© EDP Sciences, 2008

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