Issue
Eur. Phys. J. Appl. Phys.
Volume 42, Number 2, May 2008
Page(s) 129 - 139
Section Characterization of Materials: Imaging, Microscopy and Spectroscopy
DOI http://dx.doi.org/10.1051/epjap:2008034
Published online 28 March 2008

© EDP Sciences, 2008