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Eur. Phys. J. Appl. Phys. 42, 129-139 (2008)
DOI: 10.1051/epjap:2008034
Active spectro-polarimetric imaging: signature modeling, imaging demonstrator and target detection
M. Alouini1, F. Goudail2, N. Roux3, L. Le Hors4, P. Hartemann1, S. Breugnot4 and D. Dolfi11 Thales Research & Technology - France, RD 128, 91767 Palaiseau Cedex, France
2 Laboratoire Charles Fabry de l'Institut d'Optique, CNRS, Univ Paris-Sud, Campus Polytechnique, RD 128, 91127 Palaiseau, France
3 Physics and Image Processing Group/Fresnel Institute, Domaine Universitaire de Saint-Jérôme, 13397 Marseille Cedex 20, France
4 Thales Oprtonics Thales Optronique SA, rue Guynemer, BP 55, 78283 Guyancourt Cedex, France
mehdi.alouini@thalesgroup.com
(Received: 16 October 2007 / Received in final form: 11 January 2008 / Accepted: 15 January 2008 / Published online: 28 March 2008)
Abstract
We report on the synthesis of our work on the analysis of
active spectro-polarimetric imaging concept of real-world scenes. These
synthesis extend from the investigation of depolarization mechanisms up to
image analysis and processing. We show in particular that depolarization
effects are wavelength dependent and strongly correlated with light
absorption of materials. Multi-wavelength images of degree of polarization
are recorded and analyzed, evidencing that the polarimetric image must be
interpreted in conjunction with its counterpart intensity image in order to
extract, the most relevant information from the scene. For real field
operation, the noise characteristics of polarimetric images are also
investigated under coherent laser illumination. The potential increase of
target detection performance brought by properly processing the active
polarimetric image is illustrated on a very low contrast scene.
42.25.Ja - Polarization.
42.30.Va - Image forming and processing.
© EDP Sciences 2008



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