Issue
Eur. Phys. J. Appl. Phys.
Volume 42, Number 2, May 2008
Page(s) 141 - 144
Section Characterization of Materials: Imaging, Microscopy and Spectroscopy
DOI http://dx.doi.org/10.1051/epjap:2008050
Published online 29 April 2008

© EDP Sciences, 2008

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