Issue
Eur. Phys. J. Appl. Phys.
Volume 42, Number 2, May 2008
Page(s) 75 - 80
Section Microelectronics and Optoelectronics
DOI http://dx.doi.org/10.1051/epjap:2008033
Published online 28 March 2008

© EDP Sciences, 2008

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