Issue
Eur. Phys. J. Appl. Phys.
Volume 39, Number 2, August 2007
NUMELEC 2006
Page(s) 171 - 174
Section Characterization of Materials: Imaging, Microscopy and Spectroscopy
DOI http://dx.doi.org/10.1051/epjap:2007068
Published online 10 May 2007

© EDP Sciences, 2007

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