Issue
Eur. Phys. J. Appl. Phys.
Volume 35, Number 3, September 2006
Page(s) 195 - 200
Section Characterization of Materials: Imaging, Microscopy and Spectroscopy
DOI http://dx.doi.org/10.1051/epjap:2006096
Published online 02 September 2006

© EDP Sciences, 2006

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