Issue
Eur. Phys. J. Appl. Phys.
Volume 35, Number 2, August 2006
Page(s) 145 - 148
Section Instrumentation and Metrology
DOI http://dx.doi.org/10.1051/epjap:2006082
Published online 12 July 2006

© EDP Sciences, 2006

Recommended for you