Issue
Eur. Phys. J. Appl. Phys.
Volume 35, Number 1, July 2006
Page(s) 49 - 55
Section Characterization of Materials: Imaging, Microscopy and Spectroscopy
DOI http://dx.doi.org/10.1051/epjap:2006066
Published online 23 June 2006

© EDP Sciences, 2006

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