Issue
Eur. Phys. J. Appl. Phys.
Volume 34, Number 1, April 2006
Page(s) 67 - 70
Section Instrumentation and Metrology
DOI http://dx.doi.org/10.1051/epjap:2006030
Published online 23 March 2006

© EDP Sciences, 2006

Recommended for you