Issue
Eur. Phys. J. Appl. Phys.
Volume 33, Number 2, February 2006
Page(s) 115 - 120
Section Characterization of Materials: Imaging, Microscopy and Spectroscopy
DOI http://dx.doi.org/10.1051/epjap:2006011
Published online 08 February 2006

© EDP Sciences, 2006

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