Table of contents
The European Physical Journal Applied Physics
Vol. 32 No. 3 (December 2005)
- Capacitance between two points on an infinite grid
p. 149
J.H. Asad, R.S. Hijjawi, A. Sakaji and J.M. Khalifeh
Abstract | PDF file (168 KB) | References - All the physical and electrical parameters
of the MOS transistor on a single graph (Q
p. 155
G. Vincent
Abstract | PDF file (227 KB) | References - Symmetry properties of 2D magnetic photonic crystals
with square lattice
p. 159
V. Dmitriev
Abstract | PDF file (183 KB) | References - Magnetic compensation of gravity forces in liquid/gas mixtures:
surpassing intrinsic limitations of a superconducting magnet by using
ferromagnetic inserts
p. 167
L. Quettier, H. Félice, A. Mailfert, D. Chatain and D. Beysens
Abstract | PDF file (1.85 MB) | References - Characterization of carbon and iron nanostructures synthesized by
the DC arc discharge method: influence of the location in the reactor and
of the pressure
p. 177
A. Fnidiki, D. Lemarchand, E. Talbot and H. Pascard
Abstract | PDF file (4.02 MB) | References - N-type multicrystalline silicon wafers and rear junction solar
cells
p. 187
S. Martinuzzi, O. Palais, M. Pasquinelli and F. Ferrazza
Abstract | PDF file (1.01 MB) | References - Spatial non-uniformity analyses of radiometric detectors to identify
suited transfer standards for optical radiometry
p. 193
M. Durak
Abstract | PDF file (548 KB) | References - Guided ultrasonic waves in the cylindrical layer-substrate
structures. Application to the control of the massive machine elements with
cylindrical cavities
p. 199
M. El Ouahdani, M. Sidki and A. Ramdani
Abstract | PDF file (537 KB) | References - Guided ultrasonic waves in the tri-layer structures. Application to
the non destructive ultrasonic testing of the bonding quality of sheets
p. 207
B. Bougaze, M. Sidki and A. Ramdani
Abstract | PDF file (2.31 MB) | References - Blood viscosity measurement: an integral method using Doppler
ultrasonic profiles
p. 213
P. Flaud and A. Bensalah
Abstract | PDF file (696 KB) | References
Semiconductors and Related Materials
Microelectronics and Optoelectronics
Nanomaterials and Nanotechnologies
Magnetism and Superconductivity
Characterization of Materials: Imaging, Microscopy and Spectroscopy
Instrumentation and Metrology
Physics and Mechanics of Fluids, Microfluidics
Physics of Biological Systems
© EDP Sciences 2005



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