Issue
Eur. Phys. J. Appl. Phys.
Volume 32, Number 3, December 2005
Page(s) 193 - 197
Section Instrumentation and Metrology
DOI http://dx.doi.org/10.1051/epjap:2005092
Published online 14 December 2005

© EDP Sciences, 2005

Recommended for you