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The European Physical Journal Applied Physics

Volume 27 / No 1-3 (July-September 2004)

Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)


Invited papers

Nanostructures and near-field probe techniques 1

Nanostructures and near-field probe techniques 2

Defects in silicon

Electrical properties

Defects in wide bandgap materials 1

Defects in wide bandgap materials 2

Spectroscopic techniques

Electron beam methods

Defect mapping over large area wafers

Multi-techniques investigations

X-ray based techniques

Defects in SC lasers and other devices

Electronic properties through contactless characterisation