Issue
Eur. Phys. J. Appl. Phys.
Volume 27, Number 1-3, July-September 2004
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
Page(s) 93 - 95
Section Nanostructures and near-field probe techniques 2
DOI http://dx.doi.org/10.1051/epjap:2004113
Published online 15 July 2004

© EDP Sciences, 2004

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