The European Physical Journal Applied Physics

Table of Contents - April 2002 - Volume 18 - Issue 01

Semiconductors and Devices

 
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A. Yassar, H. Jaafari, N. Rebière-Galy, M. Frigoli, C. Moustrou, A. Samat and R. Guglielmetti

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 3 - 8

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002020 (About DOI)

 

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Organic Materials and Devices

 
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K. I. Gnanasekar, B. Rambabu and K. C. Langry

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 9 - 15

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002021 (About DOI)

 

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Surfaces, Interfaces and Films

 
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A.-M. Bottreau, N. Bouzit and Az. Merzouki

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 17 - 24

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002022 (About DOI)

 

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J. P. Ponpon and M. Amann

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 25 - 31

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002023 (About DOI)

 

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N. Viart, G. Pourroy and J.-M. Greneche

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 33 - 40

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002024 (About DOI)

 

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Plasma, Discharges and Processes

 
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A. Szkatula, M. Balanda and M. Kopeć

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 41 - 49

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002025 (About DOI)

 

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Kwang-Hua W. Chu

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 51 - 56

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002026 (About DOI)

 

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Ph. Speck, Y. M. Gbamele, Ph. Desevaux, P. K. Panday and J. P. Prenel

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 57 - 61

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002027 (About DOI)

 

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Instrumentation and Metrology

 
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F. E. Ratolojanahary, J. M. Dorkel and P. Tounsi

The European Physical Journal Applied Physics / Volume 18 / Issue 01 / 2002, pp 63 - 75

© EDP Sciences, 2002

Published online by Cambridge University Press: 18 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2002028 (About DOI)

 

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