The European Physical Journal - Applied Physics Vol. 24 Iss. 03

The European Physical Journal Applied Physics

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Table of Contents - December 2003 - Volume 24 - Issue 03

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Semiconductors and Devices

Breakdown voltage analysis of neutron irradiated silicon detectors Breakdown voltage analysis of neutron irradiated silicon detectors

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A. Bhardwaj, K. Ranjan, Namrata, S. Chatterji, A. K. Srivastava, A. Kumar, M. K. Jha and R. K. Shivpuri

The European Physical Journal Applied Physics / Volume 24 / Issue 03 / 2003, pp 171 - 188

Published online by Cambridge University Press: 14 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2003073-1 (About DOI)

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Influence of an applied electric field on the electronic properties of Si δ-doped GaAs Influence of an applied electric field on the electronic properties of Si δ-doped GaAs

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E. Ozturk, Y. Ergun, H. Sari and I. Sokmen

The European Physical Journal Applied Physics / Volume 24 / Issue 03 / 2003, pp 189 - 194

Published online by Cambridge University Press: 14 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2003074 (About DOI)

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Organic Materials and Devices

Degradation kinetics of the spectral emission in polyfluorene light-emitting electro-chemical cells and diodes Degradation kinetics of the spectral emission in polyfluorene light-emitting electro-chemical cells and diodes

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T. Ouisse, O. Stéphan and M. Armand

The European Physical Journal Applied Physics / Volume 24 / Issue 03 / 2003, pp 195 - 200

Published online by Cambridge University Press: 14 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2003067 (About DOI)

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Magnetism, Superconductivity and Related Devices

Study of high intensity magnetic separation process in grooved plate matrix Study of high intensity magnetic separation process in grooved plate matrix

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N. M. Sido, A. Mailfert, G. Gillet and A. Colteu

The European Physical Journal Applied Physics / Volume 24 / Issue 03 / 2003, pp 201 - 207

Published online by Cambridge University Press: 14 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2003077 (About DOI)

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Imaging, Microscopy and Spectroscopy

Crystal-field analysis of the Cr⁴⁺ absorption and excitation spectrum in LiGaO₂ oxide crystal Crystal-field analysis of the Cr⁴⁺ absorption and excitation spectrum in LiGaO₂ oxide crystal

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S. Kammoun and M. Kamoun

The European Physical Journal Applied Physics / Volume 24 / Issue 03 / 2003, pp 209 - 213

Published online by Cambridge University Press: 14 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2003065 (About DOI)

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Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction Atomic-scale analysis of interfaces in an all-oxide magnetic tunnel junction

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J.-L. Maurice, F. Pailloux, D. Imhoff, N. Bonnet, L. Samet, A. Barthélémy, J.-P. Contour, C. Colliex and A. Fert

The European Physical Journal Applied Physics / Volume 24 / Issue 03 / 2003, pp 215 - 221

Published online by Cambridge University Press: 14 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2003071 (About DOI)

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Identification of physical effects in flying spot photothermal non-destructive testing Identification of physical effects in flying spot photothermal non-destructive testing

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S. Hermosilla-Lara, P.-Y. Joubert and D. Placko

The European Physical Journal Applied Physics / Volume 24 / Issue 03 / 2003, pp 223 - 229

Published online by Cambridge University Press: 14 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2003081 (About DOI)

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Instrumentation and Metrology

Calibration of a 2 dimensional hydrogenated amorphous silicon thin film position sensitive detector (2D a-Si:H TFPSD) Calibration of a 2 dimensional hydrogenated amorphous silicon thin film position sensitive detector (2D a-Si:H TFPSD)

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K. Gnanvo and Z. Y. Wu

The European Physical Journal Applied Physics / Volume 24 / Issue 03 / 2003, pp 231 - 239

Published online by Cambridge University Press: 14 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2003072 (About DOI)

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