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Table of Contents - September 2008 - Volume 43 - Issue 03 (Topical Issue ITFPC (Innovations on Thin Films Processing and Characterisation))
T. Czerwiec, M. Belmahi and S. Andrieu
© EDP Sciences, 2008
Published online by Cambridge University Press: 31 January 2011
DOI: http://dx.doi.org/10.1051/epjap:2008099 (About DOI)
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P. Müller
DOI: http://dx.doi.org/10.1051/epjap:2008071 (About DOI)
F. Rossi, F. Bretagnol, A. Valsesia and P. Colpo
DOI: http://dx.doi.org/10.1051/epjap:2008077 (About DOI)
A. V. Batrakov, A. B. Markov, G. E. Ozur, D. I. Proskurovsky and V. P. Rotshtein
DOI: http://dx.doi.org/10.1051/epjap:2008070 (About DOI)
R. Morent, N. De Geyter, L. Gengembre, C. Leys, E. Payen, S. Van Vlierberghe and E. Schacht
DOI: http://dx.doi.org/10.1051/epjap:2008076 (About DOI)
T. Moudakir, G. Orsal, N. Maloufi, A. A. Sirenko, S. Gautier, M. Bouchaour, S. Ould Saad, J. P. Salvestrini and A. Ougazzaden
DOI: http://dx.doi.org/10.1051/epjap:2008144 (About DOI)
C. Becker, S. Etienne, J. Bour, D. Ruch and F. Aubriet
DOI: http://dx.doi.org/10.1051/epjap:2008110 (About DOI)
B. Abdallah, C. Duquenne, M. P. Besland, E. Gautron, P. Y. Jouan, P. Y. Tessier, J. Brault, Y. Cordier and M. A. Djouadi
DOI: http://dx.doi.org/10.1051/epjap:2008082 (About DOI)
P. Morin, D. Benoit and J. Metz
DOI: http://dx.doi.org/10.1051/epjap:2008081 (About DOI)
N. M. G. Parreira, T. Polcar, N. J. M. Carvalho and A. Cavaleiro
DOI: http://dx.doi.org/10.1051/epjap:2008068 (About DOI)
J. X. Zou, T. Grosdidier, K. M. Zhang, C. Dong and S. Weber
DOI: http://dx.doi.org/10.1051/epjap:2008072 (About DOI)
V. Godinho, C. Fernández-Ramos, D. Martínez-Martínez, J. García-López, J. C. Sánchez-López and A. Fernández
DOI: http://dx.doi.org/10.1051/epjap:2008114 (About DOI)
K. M. Zhang, J. X. Zou, T. Grosdidier, C. Dong and S. Weber
DOI: http://dx.doi.org/10.1051/epjap:2008083 (About DOI)
M. Drouet, J. C. Stinville, P. Villechaise, J. P. Rivière and C. Templier
DOI: http://dx.doi.org/10.1051/epjap:2008138 (About DOI)
M. Guláš, C. S. Cojocaru, C. T. Fleaca, S. Farhat, P. Veis and F. Le Normand
DOI: http://dx.doi.org/10.1051/epjap:2008111 (About DOI)
F. Bonell, A. M. Bataille, S. Andrieu, C. Tiusan, B. Kierren, G. Lengaigne and D. Lacour
DOI: http://dx.doi.org/10.1051/epjap:2008100 (About DOI)
F. Rebib, N. Laidani, G. Gottardi, V. Micheli, R. Bartali, Y. Jestin, E. Tomasella, M. Ferrari and L. Thomas
DOI: http://dx.doi.org/10.1051/epjap:2008129 (About DOI)