The European Physical Journal Applied Physics

Table of Contents - August 2001 - Volume 15 - Issue 02

Semiconductors and Devices

 
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A. Doğan, Y. Havvatoğlu and A. Arslan

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 79 - 84

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001169 (About DOI)

 

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Surfaces, Interfaces and Films

 
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F. Caleyo, T. Baudin, M. H. Mathon and R. Penelle

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 85 - 96

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001170 (About DOI)

 

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A. Mouhsen, M. E. Achour, J. L. Miane and J. Ravez

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 97 - 104

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001171 (About DOI)

 

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Nanomaterials and Nanotechnologies

 
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H. Gheraia, E. M. Berkouk and G. Manesse

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 105 - 115

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001172 (About DOI)

 

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Magnetism, Superconductivity and Related Devices

 
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A. Poncet, C. Faugeras and M. Mouis

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 117 - 121

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001103 (About DOI)

 

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Imaging, Microscopy and Spectroscopy

 
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S. Vongphouthone, H. Piquet and H. Foch

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 123 - 133

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001173 (About DOI)

 

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Plasma, Discharges and Processes

 
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C. Hérault, V. Leconte, Y. Maréchal and G. Meunier

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 135 - 140

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001174 (About DOI)

 

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Instrumentation and Metrology

 
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G. Couturier, J. P. Aimé, J. Salardenne and R. Boisgard

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 141 - 147

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001175 (About DOI)

 

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N. Moussy, B. Pannetier and H. Courtois

The European Physical Journal Applied Physics / Volume 15 / Issue 02 / 2001, pp 149 - 150

© EDP Sciences, 2001

Published online by Cambridge University Press: 21 February 2011

DOI: http://dx.doi.org/10.1051/epjap:2001176 (About DOI)

 

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