The European Physical Journal Applied Physics
- The European Physical Journal Applied Physics May 2004 26 : pp 123-131
- © EDP Sciences, 2004
- DOI: http://dx.doi.org/10.1051/epjap:2004029 (About DOI)
- Published online by Cambridge University Press: 11 February 2011
Instrumentation and Metrology
High resolution microscopy techniques for the analysis of biological samples: a comparison
M. Milania1, M. Ballerinia1, D. Batania2, F. Squadrinia3, F. Cotellia4, C. Lora Lamia Donina4, G. Polettia4, A. Pozzia4, K. Eidmanna5, A. Steada6 and G. Lucchinia2
Dipartimento di Scienza dei Materiali and INFM, Università di Milano-Bicocca, Via Cozzi 53, 20126 Milano, Italy
Dipartimento di Fisica “G. Occhialini” and INFM, Università di Milano-Bicocca, Piazza della Scienza 3, 20126 Milano, Italy
Institute of Infectious and Tropical Diseases, University of Modena, Italy
Università di Milano, Milano, Italy
MPQ, Max Planck Institute für Quantenoptik, Garching, Germany
Royal Hallway College, University of London, UK
Abstract
Performances and advantages of different high-resolution microscopy techniques are compared. These include Soft X-ray Contact Microscopy (SXCM), Atomic Force Microscopy (AFM), Focused Ion Beam (FIB) and Transmission Electron Microscopy (TEM). It is shown that they allow complementary approaches to imaging of biological objects. These techniques have been used to image the same type of cells (Saccharomyces cerevisiae) thus providing a common benchmark. In particular it is shown that the novel FIB technique allows easy target cell selection, fast operation, high resolution, 3D imaging and sample manipulation during imaging.
(Received October 23 2001)
(Revised November 10 2003)
(Accepted December 11 2003)
(Online publication April 7 2004)
PACS:
- 79.20.Rf – Atomic, molecular, and ion beam impact and interactions with surfaces;
- 87.64.Dz – Scanning tunneling and atomic force microscopy;
- 87.64.Ee – Electron microscopy
